The 66th JSAP Spring Meeting, 2019

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[9a-M112-1~12] 6.6 Probe Microscopy

Sat. Mar 9, 2019 9:00 AM - 12:00 PM M112 (H112)

Satoshi Katano(Tohoku Univ.)

9:00 AM - 9:15 AM

[9a-M112-1] Identification of Si and Ge atoms from energy dissipation images obtained by non-contact atomic force microscopy

〇Daiki Kura1, Toshiki Tsuji1, Masahiko Tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.JAIST)

Keywords:nc-AFM, identification of elements