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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[9a-M112-1~12] 6.6 Probe Microscopy

Sat. Mar 9, 2019 9:00 AM - 12:00 PM M112 (H112)

Satoshi Katano(Tohoku Univ.)

9:30 AM - 9:45 AM

[9a-M112-3] Structural analysis of multilayer silicene by atomic force microscopy

Keisuke Yabuoshi¹, 〇Yoshiaki Sugimoto¹ (1.Univ. Tokyo)

Keywords:Silicene, Atomic force microscopy