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[9a-PA1-10] Control of lattice defect in Mg2Sn single crystal by changing synthesis pressure
Keywords:thermoelectric material, Mg2Sn, lattice defects
Recently, we succeeded in analyzing lattice defects in Mg2Sn: a small amount of Mg vacancies (VMg) existed. Since VMg is an accepter-type defect, it is considered that the hole carrier concentration increases with increasing the amount of VMg. In this report, we tried to control of lattice defect in Mg2Sn single crystal by changing synthesis pressure. Mg2Sn single crystals were prepared by using the melt growth method under (A) vacuum, (B) Ar 0.6 atm, and (C) Ar 1.3 atm. The Seebeck coefficient values at room temperature of the single crystal gradually decreased with increasing Ar pressure. These results sugested that the amount of VMg increases with increasing the Ar pressure.