The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[9p-PA5-1~12] 6.6 Probe Microscopy

Sat. Mar 9, 2019 4:00 PM - 6:00 PM PA5 (PA)

4:00 PM - 6:00 PM

[9p-PA5-9] Measurement of Transfer Function of the Tip-sample Voltage and Generation of Constant Amplitude Sweeps by Electrostatic Force Microscopy

Tatsuya Yamamoto1, Izumi Ryo1, Naitoh Yoshitaka1, Yan Jun Li1, Sugawara Yasuhiro1 (1.Osaka Univ.)

Keywords:electrostatic force microscopy, microwave, atomic force microscopy