The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

21 Joint Session K "Wide bandgap oxide semiconductor materials and devices" » 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[9p-S011-1~13] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

Sat. Mar 9, 2019 1:45 PM - 5:15 PM S011 (South Lecture Bldg.)

Yukiharu Uraoka(NAIST), Takayoshi Oshima(Saga Univ.)

3:00 PM - 3:15 PM

[9p-S011-6] Reactive sputtering deposition of p-type NiO films using a helicon-wave-excited-plasma

Kohei Shima1, Kazunobu Kojima1, Shigefusa Chichibu1 (1.IMRAM Tohoku Univ.)

Keywords:NiO, helicon-wave-excited-plasma sputtering, p-type transparent conducting films

NiOは、禁制帯幅が約4 eVの半導体でありp型導電性を示すため、p型透明導電膜としての応用が期待される。本研究では、プラズマ損傷が少ない反応性ヘリコン波励起プラズマスパッタ法によりp型NiO堆積を試みた。