3:00 PM - 3:15 PM
[9p-S422-3] Observation of Point Defect Distributions in Detached CZ Si Crystals from Melt (1) -Vacancy Concentrations in each predominant defect regions measured by DLTS-
Keywords:Si melt growth, point defects, DLTS
Oral presentation
15 Crystal Engineering » 15.1 Bulk crystal growth
Sat. Mar 9, 2019 1:30 PM - 6:00 PM S422 (S422)
Kei Kamada(Tohoku Univ.), Yuui Yokota(Tohoku Univ.)
3:00 PM - 3:15 PM
Keywords:Si melt growth, point defects, DLTS