The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[9p-W935-1~14] 3.8 Optical measurement, instrumentation, and sensor

Sat. Mar 9, 2019 1:15 PM - 5:15 PM W935 (W935)

Tatsutoshi Shioda(Saitama Univ.), Toshihiro Somekawa(Inst. for Laser Tech.), Tatsuo Shiina(Chiba Univ.)

1:45 PM - 2:00 PM

[9p-W935-3] Polarization Measurement with Laser Scanning Optical-Frequency-Comb Spectromicroscopy

Shota Nakano1,2, Takeo Minamikawa1,2,3, Eiji Hase1,2,4, Akifumi Asahara2,5, Takahiko Mizuno1,2, Hirotsugu Yamamoto2,6, Kaoru Minoshima2,5, Takeshi Yasui1,2 (1.Tokushima Univ., 2.JST-ERATO, 3.JST-PRESTO, 4.JASRI, 5.UEC, 6.Utsunomiya Univ.)

Keywords:optical-frequency-comb

We developed a new laser scanning optical-frequency-comb spectroscopic microscopy that can acquire spectroscopic informations of amplitude and phase of light simultaneously. It is capable of high sensitivity measurement by focusing of the laser beam. We built an optical-frequency-comb microscope that introduces optical systems of laser scanning confocal microscope. In this report, we apply this microscope to polarization measurement and evaluate polarization characteristics.