Eiji Kamiyama

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Speaker, Author, Co-Author

Fri. Sep 11, 2020 12:30 PM - 5:15 PM Z12

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[11p-Z12-1~17] 15.7 Crystal characterization, impurities and crystal defects

4:00 PM - 4:15 PM

[11p-Z12-13] Analysis of metal gettering in pn junctions by Hakoniwa method

〇Eiji Kamiyama^1,2, Hiroki Nagakura², Koji Sueoka² (1.GlobalWafers Japan Co., Ltd., 2.Okayama Pref. Univ.)