Ryo Nozaki

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Speaker, Author, Co-Author

Thu. Sep 10, 2020 12:30 PM - 6:00 PM Z09

Oral presentation
| 13 Semiconductors
| 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[10p-Z09-1~20] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

3:30 PM - 3:45 PM

[10p-Z09-12] An examination of the calculation method of the number of secondary electron emission and the validity evaluation with the measurement of sample current

〇Ryo Nozaki^1,2, Kota Ushimaru^1,2, Daisuke Kobayashi², Tomoyuki Yamamoto¹, Kazuyuki Hirose^1,2 (1.Waseda Univ., 2.ISAS/JAXA)