Ryoichiro Yoshida

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Speaker, Author, Co-Author

Tue. Sep 8, 2020 8:30 AM - 11:30 AM Z14

Oral presentation
| 2 Ionizing Radiation
| 2.1 Radiation physics and Detector fundamentals

[8a-Z14-1~12] 2.1 Radiation physics and Detector fundamentals

10:45 AM - 11:00 AM

△ [8a-Z14-10] Comparison of Gate Bias Characteristics of MOSFETs at High TID

〇Ryoichiro Yoshida¹, Arisa Kimura¹, Motoki Ando¹, Yuta Oshima¹, Shinsuke Nabeya¹, Kenji Hirakawa¹, Masayuki Iwase¹, Munehiro Ogasawara¹, Takashi Yoda¹, Noboru Ishihara¹, Hiroyuki Ito¹ (1.Tokyo Tech)

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