Sohei Nakagawa

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Speaker, Author, Co-Author

Tue. Sep 8, 2020 1:15 PM - 4:45 PM Z25

Oral presentation
| CS Code-sharing session
| 【CS.1】 Code-sharing Session of 2.4 & 7.5

[8p-Z25-1~13] 【CS.1】 Code-sharing Session of 2.4 & 7.5

1:15 PM - 1:30 PM

[8p-Z25-1] Measurement of self-sputtering yield of high energy tungsten determined from thin film thickness measurement by RBS method

〇Sohei Nakagawa¹, Yasushi Hoshino², Daiji Kato³, Takuya Majima¹, Manabu Saito¹, Hidetsugu Tsuchida¹ (1.Kyoto Univ., 2.Kanagawa Univ., 3.NIFS)