The 81st JSAP Autumn Meeting, 2020

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power electron devices and process technology

[10a-Z04-1~9] 13.7 Compound and power electron devices and process technology

Thu. Sep 10, 2020 9:30 AM - 12:00 PM Z04

Kozo Makiyama(Sumitomo Electric Industries, Ltd.)

10:30 AM - 10:45 AM

[10a-Z04-5] Temperature Properties of AlN Schottky Barrier Diodes

Masanobu Hiroki1, Yoshitaka Taniyasu1, Kazuhide Kumakura1 (1.NTT BRL)

Keywords:AlN, Schottoky barrier

We clarified Schottky barrier height (SBH) of Ni/AlN Schottky barrier diodes (SBDs) from its temperature properties. SBH estimated from I-V characteristics using thermionic emission model increases from 1.8 to 2.8 eV as temperature increases from room temperature (T.T.) to 673K. Ideality factor decreased from 1.88 to 1.15. While SBH determined from C-V characteristics is about 3.2 eV, nearly constant in the range of temperature from R.T. to 573K. SBH from I-V characteristics is proportional to the inverse of temperature, resulting from the effect of barrier inhomogeneity. From these results, the plausible SBH of Ni/AlN is 2.8-3.2 eV.