The 81st JSAP Autumn Meeting, 2020

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[10p-Z06-1~19] 6.6 Probe Microscopy

Thu. Sep 10, 2020 12:30 PM - 5:30 PM Z06

Yoichi Otsuka(Osaka Univ.), Keisuke Miyazawa(Kanazawa Univ.)

12:30 PM - 12:45 PM

[10p-Z06-1] Time-resolved measurements by Kelvin probe force microscopy with an intermittent bias application method

〇Ryota Ishibashi1, Takuji Takahashi1,2 (1.IIS, 2.NanoQuine)

Keywords:Kelvin probe Force Microscopy, Time-resolved measurement, AFM