Detection of nonmagnetic metal buried in insulator using magnetic force microscopy

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Thu. Sep 10, 2020 12:30 PM - 5:30 PM Z06

Yoichi Otsuka(Osaka Univ.), Keisuke Miyazawa(Kanazawa Univ.)

4:30 PM - 4:45 PM

〇Fujio Wakaya¹, Kenta Oosawa^1,2, Mizuki Sakamoto¹, Satoshi Abo¹, Katsuhisa Murakami², Masayoshi Nagao² (1.Osaka Univ., 2.AIST)

Keywords:magnetic force microscope, metal detector