2020年第81回応用物理学会秋季学術講演会

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13 半導体 » 13.5 デバイス/配線/集積化技術

[11a-Z09-1~12] 13.5 デバイス/配線/集積化技術

2020年9月11日(金) 08:30 〜 11:45 Z09

太田 健介(キオクシア)、中塚 理(名大)

08:45 〜 09:00

[11a-Z09-2] Improvement of electrical characteristics of junctionless transistor with BF2+ implanted poly-Si channel by boron segregation and fluorine passivation

〇(D)Minju Ahn1、Takuya Saraya1、Masaharu Kobayashi1、Toshiro Hiramoto1 (1.Institute of Industrial Science, The University of Tokyo)

キーワード:Juntionless transistor, Polycrystalline silicon, Fluorine

In this work, we experimentally investigated the dependence of dopant types (P+, B+, BF2+) on the poly-Si JL transistors. We found that BF2+ implanted poly-Si JL transistors have superior electrical characteristics such as steep SS and high carrier mobility to others, and it is expected that the passivation effect of F is remarkably effective even in the JL poly-Si transistors.