9:30 AM - 9:45 AM
△ [11a-Z23-3] Characterization of the electron mobility along the c-axis in 4H-SiC
Keywords:SiC, mobility, Hall effect measurement
Oral presentation
15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)
Fri. Sep 11, 2020 9:00 AM - 11:30 AM Z23
Norihiro Hoshino(CRIEPI)
9:30 AM - 9:45 AM
Keywords:SiC, mobility, Hall effect measurement