The 81st JSAP Autumn Meeting, 2020

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Symposium (Oral)

Symposium » Materials Science and Advanced Electronics Created by Singularity of Nitride Semiconductors -Frontiers in defect physics: Concerted approach of characterization and theory-

[8p-Z02-1~8] Materials Science and Advanced Electronics Created by Singularity of Nitride Semiconductors -Frontiers in defect physics: Concerted approach of characterization and theory-

Tue. Sep 8, 2020 1:30 PM - 5:30 PM Z02

Yoshihiro Ishitani(Chiba Univ.), Akira Sakai(Osaka Univ.)

2:30 PM - 3:00 PM

[8p-Z02-3] Electromagnetic field imaging at local structures by DPC STEM

〇Naoya Shibata1,2 (1.Univ. Tokyo, 2.JFCC)

Keywords:Electron microscopy, Electromagnetic field, interface

In this talk, I will report the basic principles and recent applications of electromagetic field imaging inside materials by using DPC STEM. I will also introduce the new possibilities of magnetic-field-free atomic resolution STEM currently under development.