The 81st JSAP Autumn Meeting, 2020

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Oral presentation

16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[8p-Z26-1~23] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

Tue. Sep 8, 2020 1:00 PM - 7:30 PM Z26

Tsuyoshi Honma(Nagaoka Univ. of Tech.), Akira Saitoh(Ehime Univ.), Tamihiro Gotoh(Gunma Univ.), Norimitsu Yoshida(Gifu Univ.)

7:15 PM - 7:30 PM

[8p-Z26-23] X-ray Total Structure Factor of SiO2 Glasses Exhibiting Different Fictive Temperatures

〇Hirokazu Masai1, Shinji Kohara2, Yohei Onodera3, Akitoshi Koreeda4, Yasuhiro Fujii4, Kazuya Satio5 (1.AIST, 2.NIMS, 3.Kyoto Univ., 4.Ritsumeikan Univ., 5.Toyota Tech. Inst.)

Keywords:Glass, Fictive temperature