The 81st JSAP Autumn Meeting, 2020

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[9a-Z06-1~11] 6.6 Probe Microscopy

Wed. Sep 9, 2020 8:30 AM - 12:00 PM Z06

Yoshiaki Sugimoto(Univ. of Tokyo), Toyokazu Yamada(Chiba Univ.)

10:15 AM - 10:30 AM

△ [9a-Z06-5] NC-AFM observation of charge-ordered Fe3O4 thin film surface

〇Seiichiro Ishikawa1, Subagyo Agus1, Hosoi Hirotaka2, Sueoka Kazuhisa1 (1.Graduate School of IST, Hokkaido Univ., 2.CRIS, Hokkaido Univ.)

Keywords:Non-contact atomic force microscopy, Fe3O4 thin film, charge ordering