Evaluation of the dependent of memory effect in SmNiO<sub>3</sub> proton registers on history of voltage application

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

Wed. Sep 9, 2020 9:00 AM - 11:30 AM Z07

Yasushi Hirose(Univ. of Tokyo)

9:45 AM - 10:00 AM

〇Shin Nonaka¹, Azusa Hattori¹, Hidekazu Tanaka¹ (1.ISIR, Osaka Univ)

Keywords:transition metal oxides, strongly correlated electron, proton device