Boyang Cui

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Speaker, Author, Co-Author

Thu. Mar 12, 2020 1:45 PM - 5:15 PM A305 (6-305)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[12p-A305-1~13] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

2:00 PM - 2:15 PM

▼ [12p-A305-2] Detection of Charge Traps in Silicon Nanowire MOSFETs Using Transient Current Measurements

〇(M2)Boyang Cui¹, Tomoko Mizutani¹, Kiyoshi Takeuchi¹, Takuya Saraya¹, Masaharu Kobayashi¹, Masaharu Kobayashi^1,2, Toshiro Hiramoto¹ (1.IIS, Univ. of Tokyo, 2.d.lab,Univ of Tokyo)

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