Tomoko Mizutani

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Speaker, Author, Co-Author

Thu. Mar 12, 2020 1:45 PM - 5:15 PM A305 (6-305)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[12p-A305-1~13] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

3:45 PM - 4:00 PM

[12p-A305-8] Statistical Analysis of Temperature Dependence of Worst Case Data Retention Voltage in SRAM Using Extreme Value Theory

〇Tomoko Mizutani¹, Kiyoshi Takeuchi¹, Takuya Saraya¹, Masaharu Kobayashi^1,2, Toshiro Hiramoto¹ (1.IIS,Univ. of Tokyo, 2.d.lab,Univ. of Tokyo)