Takuya Maeda

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Speaker, Author, Co-Author

Thu. Mar 12, 2020 1:15 PM - 5:30 PM B401 (2-401)

Oral presentation
| 13 Semiconductors
| 13.7 Compound and power electron devices and process technology

[12p-B401-1~16] 13.7 Compound and power electron devices and process technology

3:45 PM - 4:00 PM

[12p-B401-10] Measurement of Electron and Hole Impact Ionization Coefficients in GaN

〇Takuya Maeda¹, Tetsuo Naita², Shinji Yamada^3,4,5, Tetsu Kachi³, Tsunenobu Kimoto¹, Masahiro Horita^1,3,5, Jun Suda^1,3,5 (1.Kyoto Univ., 2.TOYOTA Central R&D Labs., 3.Nagoya Univ. IMaSS, 4.ULVAC ISET, 5.Nagoya Univ.)

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