Gyozen Sai

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Speaker, Author, Co-Author

Fri. Mar 13, 2020 9:30 AM - 11:30 AM PA6 (PA)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[13a-PA6-1~11] 15.6 Group IV Compound Semiconductors (SiC)

9:30 AM - 11:30 AM

▲ [13a-PA6-6] Influence of Interface Traps on Split C-V Characteristics of 4H-SiC MOSFETs

〇(D)Gyozen Sai¹, Dai Okamoto¹, Noriyuki Iwamoro¹, Hiroshi Yano¹ (1.Univ. Tsukuba)