The 67th JSAP Spring Meeting 2020

Presentation information

Poster presentation

13 Semiconductors » 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[12a-PB4-1~13] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

Thu. Mar 12, 2020 9:30 AM - 11:30 AM PB4 (PB)

9:30 AM - 11:30 AM

[12a-PB4-9] Evaluation of Errors in 3D NAND Flash Memories for Read-intensive Applications

Hiroki Aihara1, Kyosuke Maeda1, Shun Suzuki1, Ken Takeuchi1 (1.Chuo Univ)

Keywords:NAND-Flash memory