The 67th JSAP Spring Meeting 2020

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Symposium (Oral)

Symposium » Materials Science and Advanced Electronics Created by Singularity of Nitride Semiconductors -Frontiers in defect physics: Merging characterization and theory-

[12p-A307-1~8] Materials Science and Advanced Electronics Created by Singularity of Nitride Semiconductors -Frontiers in defect physics: Merging characterization and theory-

Thu. Mar 12, 2020 1:30 PM - 5:30 PM A307 (6-307)

Yoshihiro Ishitani(Chiba Univ.), Akira Sakai(Osaka Univ.)

2:30 PM - 3:00 PM

[12p-A307-3] Electromagnetic field structure imaging at material interfaces by DPC STEM

〇Naoya Shibata1,2 (1.Univ. Tokyo, 2.NSRL)

Keywords:Electron microscopy, Electromagnetic field, interface

In this talk, the current status and future prospects of electromagnetic field structure imaging at material and device interfaces by DPC STEM will be discussed.