The 67th JSAP Spring Meeting 2020

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[12p-D411-1~14] 6.3 Oxide electronics

Thu. Mar 12, 2020 1:45 PM - 5:30 PM D411 (11-411)

Shoso Shingubara(Kansai Univ.), Shinya Aikawa(Kougakuin Univ.)

1:45 PM - 2:00 PM

[12p-D411-1] Initial characteristics and analog switching behaviors of VCM and ECM based Ta2O5-δ resistive memories

Yuanlin Li1, Atsushi Tsurumaki-Fukuchi1, Masashi Arita1, Yasuo Takahashi1, Takashi Morie2 (1.Hokkaido Univ., 2.Kyushu Inst. Tech.)

Keywords:resistive memories, initial states, switching modes

Resistive memories can be categorized to two switching modes by the types of conductive filament, valence change memory (VCM) and electrochemical memory (ECM), because the electrical characteristics are strongly depended on the material selection. Although these two modes were reported widely, a detailed comparison is still lacking. In this work, to compare the two switching modes for their initial states and switching behaviors, we systematically fabricated the insulator Ta2O5-δ and different top electrodes were applied to achieve the two modes.