10:45 AM - 11:00 AM
[13a-A409-7] Nanosecond Time Resolved Analysis of Channel Formation in OTFT with Device Simulation and Time Domain Reflectometry
Keywords:organic semiconductor, carrier injection, channel formation process
We will talk about initial process of channel formation in OTFT before beginning to in-plane spreading of hole distribution with time domain reflectometry (TDR) and device simulator. TDR is electrical impedance detection method that we had proposed to detect the time variation of device impedance with nanosecond time resolution.