The 67th JSAP Spring Meeting 2020

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6 Thin Films and Surfaces » 6.3 Oxide electronics

[13a-PA3-1~35] 6.3 Oxide electronics

Fri. Mar 13, 2020 9:30 AM - 11:30 AM PA3 (PA)

9:30 AM - 11:30 AM

[13a-PA3-11] Factors determining the resistance retention characteristics of perovskite-type resistive memory

〇(B)Yuta Hashimoto1, Kentaro Kinoshita1 (1.Tokyo Univ. of sci.)

Keywords:Nb:STO, data retention, low temperature