[13p-B408-1~16] 11.1 Fundamental properties

[13p-B408-12] Dependence of penetration depth on x in FeSe_1-xTe _x films by superconducting resonators

〇Atsutaka Maeda¹, Souta Nakamura¹, Hotaka Kurokawa¹, Naoki Shikama¹, Yuki Sakishita¹, Fuyuki Nabeshima¹, Yue Sun², Haruhisa Kitano² (1.Univ. Tokyo, 2.Aoyama Gakuin Univ.)

Keywords:penetration depth, Iron chalcogenides, this films

We synthesized FeSe_1-xTe_x film samples for all x values by PLD technique. They were fabricated into coplanar resonators by the sandblasting technique and the Ar iron milling technique, to measure the penetration depth. The measured low-temperature penetration depth did not change at the orthorhombic to tetragonal boundary, which is in shart contrast to the behavior of Tc. We will discuss this result in terms of the superconducting gap structure.