2020年第67回応用物理学会春季学術講演会

講演情報

一般セッション(ポスター講演)

15 結晶工学 » 15.4 III-V族窒化物結晶

[13p-PB1-1~29] 15.4 III-V族窒化物結晶

2020年3月13日(金) 16:00 〜 18:00 PB1 (第1体育館)

16:00 〜 18:00

[13p-PB1-22] Improvement of current injection efficiency in AlGaN-based deep-ultraviolet light-emitting diodes via strains

GUODONG HAO1、MANABU TANIGUCHI1、SHIN-ICHIRO INOUE1 (1.NICT)

キーワード:DUV-LEDs, AlGaN, Current injection efficiency

AlGaN-based deep ultraviolet (DUV) light-emitting diodes (LEDs) offer a compact, environment-friendly alternative to traditional mercury vapor lamps and bulbs as light sources. However, the power conversion efficiency of DUV-LEDs decreases rapidly as the emission wavelength decreases. The low current injection efficiency (CIE) is one factor that limits the efficiency of electrically-injected AlGaN-based DUV-LEDs. It is well known that the performance of the DUV-LEDs is sensitive to the strains in the epilayers. A number of researchers focused on strain effects on the radiative recombination efficiency due to the quantum-confined Stark effect (QCSE) of the quantum wells (QWs). The strain effects on the light extraction efficiency via the modulation of the photon polarization have also been investigated extensively. In this talk, we report the discovery of strain effects on the CIE in AlGaN-based DUV-LEDs.