[14a-A201-1~8] Nano-cybernetics of interface bonded at room or low temperature and ultra thin films at heterojunction interface

[14a-A201-8] Growth Mechanism of Aerosol Deposition Films Investigated by Synchrotron Radiation X-ray Diffraction

〇Yoshihiro Kuroiwa¹ (1.Hiroshima Univ.)

Keywords:aerosol deposition method, crystal structure analysis, synchrotron radiation X-ray diffraction

Crystal structures and phase transitions in aerosol deposition (AD) films of oxide ferroelectrics are investigated by synchrotron radiation X-ray diffraction to clarify the mechanism of film growth based on the orientation characteristics of films and the chemical bonding.