2020年第67回応用物理学会春季学術講演会

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一般セッション(ポスター講演)

9 応用物性 » 9.2 ナノ粒子・ナノワイヤ・ナノシート

[14a-PA2-1~18] 9.2 ナノ粒子・ナノワイヤ・ナノシート

2020年3月14日(土) 09:30 〜 11:30 PA2 (第3体育館)

09:30 〜 11:30

[14a-PA2-13] Fabrication of Vertical Aligned Germanium Nanowires by Nanoimprint Lithography

Yonglie Sun1,2、Jevasuwan Wipakorn1、Fukata Naoki1,2 (1.NIMS、2.Univ. of Tsukuba)

キーワード:germanium, nanoimprint lithography, Bosch process

Vertical Ge nanowire arrays are of particular interest due to their large surface to volume ratio and high integration that has been proposed to be an ideal material for a high-speed vertical gate-all-around field-effect transistor (FET). On the other hand, nanoimprint lithography (NIL) and Bosch process have been widely used to achieve Si nanowire array with small diameter and high aspect ratio. However, there are few reports on top-down fabrication of Ge nanowire array. This study’s aim is to develop a method to fabricate uniform Ge nanowire arrays with a smooth surface by nanoimprint lithography and Bosch process.