Jun Furuta

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Speaker, Author, Co-Author

Fri. Sep 10, 2021 9:00 AM - 11:45 AM N206 (Oral)

Oral presentation
| 2 Ionizing Radiation
| 2.2 Radiation physics fundamentals & applications, radiation generators, new technology

[10a-N206-1~10] 2.2 Radiation physics fundamentals & applications, radiation generators, new technology

9:30 AM - 9:45 AM

[10a-N206-3] Degradation of SiC MOSFET Induced by Total Ionizing Dose Effect Using Alpha Source

〇Jun Furuta¹, Kazutoshi Kobayashi¹ (1.Kyoto Inst. of Tech.)