Kidist Moges Ayele

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Speaker, Author, Co-Author

Sat. Sep 11, 2021 1:30 PM - 4:15 PM N305 (Oral)

Oral presentation
| 13 Semiconductors
| 13.7 Compound and power devices, process technology and characterization

[11p-N305-1~10] 13.7 Compound and power devices, process technology and characterization

3:00 PM - 3:15 PM

▲ [11p-N305-6] Evaluation of long-term reliability of 4H-SiC(0001) CMOS ring oscillators at high temperature

〇(PC)Kidist Moges Ayele¹, Takuma Kobayashi¹, Takuji Hosoi¹, Takayoshi Shimura¹, Keita Tachiki², Tsunenobu Kimoto², Heiji Watanabe¹ (1.Graduate School of Eng., Osaka Univ., 2.Graduate School of Eng., Kyoto Univ.)

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