[10a-N204-1~12] CS.10 Code-sharing Session of 6.5 & 7.6

[10a-N204-10] XPS Measurement of Trace Dopants in Bilayer Graphene using Active Shirley Method

〇Shuichi Ogawa¹, Takatoshi Yamada², Yuki Okigawa², Tomoaki Masuzawa³, Yasutaka Tsuda⁴, Akitaka Yoshigoe⁴, Tadashi Abukawa¹ (1.Tohoku Univ., 2.AIST, 3.Shizuoka Univ., 4.JAEA)

Keywords:graphene, XPS, Intercalation

The concentration of a small amount of doped K atoms in graphene was measured by XPS using high-brilliance synchrotron radiation.The K 2p peak overlapped with the hem of the asymmetric C1s peak, and the peak intensity could not be determined by the background removal using the usual Shirley method. In order to solve this problem, we applied the dynamic Shirley method to obtain the K 2p intensity by using a background removal method that takes into account the hem of the C1s peak.