[10a-N401-1~9] 7.2 Applications and technologies of electron beams

[10a-N401-8] Development of Ultrafast Scanning Electron Microscope Using Femtosecond Laser for Observation of Surface Carrier Dynamics

〇Yuki Yamamoto¹, Yuuga Emoto¹, Yusuke Arashida¹, Yoshiya Kishibe¹, Keishi Akada¹, Masaki Hada¹, Shoji Yoshida¹, Jun-ichi Fujita¹ (1.Univ. of Tsukuba)

Keywords:electron microscope, laser, pump-probe method

We have developed the scanning ultrafast electron microscope (S-UEM), which combines the excellent spatial resolution of an electron microscope with the temporal resolution of ultrafast femtosecond laser spectroscopy.
In this presentation, we will describe the setup of the system and discuss the pump-probe experiments using Si sample.