Oral presentation

[10a-N401-1~9] 7.2 Applications and technologies of electron beams

Fri. Sep 10, 2021 9:00 AM - 11:30 AM N401 (Oral)

Takafumi Ishida(Nagoya University), Aso Kohei(北陸先端大)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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9:00 AM - 9:15 AM

△ [10a-N401-1] Atomic-resolution STEM analysis of delithiated/pristine interface in Li₂MnO₃

〇Kei Nakayama^1,2, Ryo Ishikawa^1,3, Shunsuke Kobayashi², Naoya Shibata^1,2, Yuichi Ikuhara^1,2 (1.Univ. Tokyo, 2.JFCC, 3.JST PRESTO)

9:15 AM - 9:30 AM

△ [10a-N401-2] Visualization of Oxygen 2p Orbital by Electron Microscopy

〇(D)Chisaki Iwashimizu¹, Mitsutaka Haruta¹, Hiroki Kurata¹ (1.Inst. for Chemical Research, Kyoto univ.)

9:30 AM - 9:45 AM

[10a-N401-3] Structural Identification of Metatitanic Acid Nanoparticles with Considered Their Crystal Growth Mechanism

〇Kohei Aso¹, Koichi Higashimine¹, Yuito Kawamura¹, Yoshifumi Oshima¹ (1.JAIST)

9:45 AM - 10:00 AM

[10a-N401-4] In-situ analysis of iron-oxide-reduction with nitride ceramics

〇Nobuhiro Ishikawa¹, Tadashi Mitsui¹, Takashi Kimura², Masaki Takeguchi¹, Kazutaka Mitsuishi¹ (1.NIMS, 2.JEOL.Ltd)

10:00 AM - 10:15 AM

[10a-N401-5] Selected Area Crystallization in Amorphous Film by Electron Beam Irradiation

〇(M1)Shunsuke Tanahashi¹, Sae Ohkawara¹, Tokunaga Tomoharu¹, Yamamoto Takahisa¹ (1.Nagoya Univ.)

10:30 AM - 10:45 AM

[10a-N401-6] Focal depth extension in ADF-STEM using an electron Bessel beam

〇Takafumi Ishida¹, Masahiro Ohtsuka¹, Makoto Kuwahara¹, Koh Saitoh¹, Tadahiro Kawasaki² (1.Nagoya Univ., 2.JFCC)

10:45 AM - 11:00 AM

[10a-N401-7] Time-resolved measurement conducted by a newly developed 100-kV pulsed TEM using a photocathode-type electron source

〇Makoto Kuwahara^1,2, Lira Mizuno², Kojiro Nakakura¹, Masato Furui², Hideo Morishita^3,2, Takashi Ishida^2,1, Isao Nagaoki⁴, Toshihide Agemura⁴ (1.IMaSS, Nagoya Univ., 2.Eng. Nagoya Univ., 3.Hitachi ltd., 4.Hitachi High-Tech)

11:00 AM - 11:15 AM

[10a-N401-8] Development of Ultrafast Scanning Electron Microscope Using Femtosecond Laser for Observation of Surface Carrier Dynamics

〇Yuki Yamamoto¹, Yuuga Emoto¹, Yusuke Arashida¹, Yoshiya Kishibe¹, Keishi Akada¹, Masaki Hada¹, Shoji Yoshida¹, Jun-ichi Fujita¹ (1.Univ. of Tsukuba)

11:15 AM - 11:30 AM

[10a-N401-9] Development of ultrafast SEM by vertical illuminating configuration with femtosecond laser

〇(M2)Yuuga Emoto¹, Yuki Yamamoto¹, Yusuke Arashida¹, Yoshiya Kishibe¹, Keishi Akada¹, Shoji Yoshida¹, Masaki Hada¹, Jun-ichi Fujita¹ (1.Univ. of Tsukuba)

Oral presentation

[10p-N401-1~10] 7.2 Applications and technologies of electron beams

Fri. Sep 10, 2021 1:00 PM - 3:45 PM N401 (Oral)

Masayoshi Nagao(AIST), Takafumi Ishida(Nagoya University)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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1:00 PM - 1:15 PM

[10p-N401-1] Transition Metal Carbides with Carbon Deficiency: Work Function and Density

〇Michiko Yoshitake¹ (1.NIMS)

1:15 PM - 1:30 PM

[10p-N401-2] Elucidation of the formation mechanism of field electron emission patterns from C₆₀ molecular orbitals

〇(M2)Reiya Furusawa¹, Ryohei Tsuruta¹, Masahiro Sasaki¹, Yoichi Yamada¹ (1.Univ. Tsukuba)

1:30 PM - 1:45 PM

[10p-N401-3] Development of a spherical electron source with amorphous carbon coating

〇Ryohei Tsuruta¹, Yusuke Hyuga¹, Reiya Furusawa¹, Masahiro Sasaki¹, Soichiro Matsunaga^2,3, Yoichi Yamada¹ (1.Univ. Tsukuba, 2.Hitachi Ltd., 3.Hitachi High-Tech Co.)

1:45 PM - 2:00 PM

[10p-N401-4] Evaluation of Ga Liquid Metal Electron Source by Field Emission Microscope

〇Daiki Ando¹, Gai Hasimoto¹, Hidenori Mimura^1,2, Yoichiro Neo^1,2 (1.Shizuoka Univ., 2.RIE Shizuoka Univ.)

2:00 PM - 2:15 PM

[10p-N401-5] UV emission characteristics of Transfer Mold micro-protrusion cathode arrays

〇JONGHYUN MOON¹, Kosuke Shimizu¹ (1.Shizuoka Univ.)

2:30 PM - 2:45 PM

[10p-N401-6] Demonstration of power generation characteristics from a thermionic converter

〇Shigeya Kimura¹, Hisashi Yoshida¹, Hisao Miyazaki¹ (1.Toshiba Corp.)

2:45 PM - 3:00 PM

△ [10p-N401-7] Resistance Improvement of Graphene-Oxide-Semiconductor Planar-Type Electron Sources Against Atomic Oxygen for Low Earth Orbit Applications

〇Naoyuki Matsumoto^1,2, Yoshinori Takao¹, Masayoshi Nagao², Katsuhisa Murakami² (1.YNU, 2.AIST)

3:00 PM - 3:15 PM

△ [10p-N401-8] SEM using graphene-oxide-semiconductor type planar electron source

〇Yukino Kameda^1,2, Katsuhisa Murakami², Masayoshi Nagao², Hidenori Mimura¹, Yoichiro Neo¹ (1.Shizuoka Univ., 2.AIST.)

3:15 PM - 3:30 PM

[10p-N401-9] Electron Emission from Planar-type Electron Source based on Nanocrystalline Silicon (II)

〇Hidetaka Shimawaki¹, Katsuhisa Murakami², Masayoshi Nagao², Hidenori Mimura³ (1.Hachinohe Inst., 2.AIST, 3.Shizuoka Univ.)

3:30 PM - 3:45 PM

[10p-N401-10] Highly efficient electron emission mechanism of a graphene/SiO₂/n-Si stacked structure

〇Katsuhisa Murakami^1,2, Yoichi Yamada², Yoichiro Neo³, Yoshinori Takao⁴, Masahiro Sasaki², Hidenori Mimura³, Masayoshi Nagao¹ (1.AIST, 2.Univ. Tsukuba, 3.Shizuoka Univ., 4.YNU)

Sessions

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[10a-N401-1~9] 7.2 Applications and technologies of electron beams

△ [10a-N401-1] Atomic-resolution STEM analysis of delithiated/pristine interface in Li₂MnO₃

△ [10a-N401-2] Visualization of Oxygen 2p Orbital by Electron Microscopy

[10a-N401-3] Structural Identification of Metatitanic Acid Nanoparticles with Considered Their Crystal Growth Mechanism

[10a-N401-4] In-situ analysis of iron-oxide-reduction with nitride ceramics

[10a-N401-5] Selected Area Crystallization in Amorphous Film by Electron Beam Irradiation

[10a-N401-6] Focal depth extension in ADF-STEM using an electron Bessel beam

[10a-N401-7] Time-resolved measurement conducted by a newly developed 100-kV pulsed TEM using a photocathode-type electron source

[10a-N401-8] Development of Ultrafast Scanning Electron Microscope Using Femtosecond Laser for Observation of Surface Carrier Dynamics

[10a-N401-9] Development of ultrafast SEM by vertical illuminating configuration with femtosecond laser

[10p-N401-1~10] 7.2 Applications and technologies of electron beams

[10p-N401-1] Transition Metal Carbides with Carbon Deficiency: Work Function and Density

[10p-N401-2] Elucidation of the formation mechanism of field electron emission patterns from C₆₀ molecular orbitals

[10p-N401-3] Development of a spherical electron source with amorphous carbon coating

[10p-N401-4] Evaluation of Ga Liquid Metal Electron Source by Field Emission Microscope

[10p-N401-5] UV emission characteristics of Transfer Mold micro-protrusion cathode arrays

[10p-N401-6] Demonstration of power generation characteristics from a thermionic converter

△ [10p-N401-7] Resistance Improvement of Graphene-Oxide-Semiconductor Planar-Type Electron Sources Against Atomic Oxygen for Low Earth Orbit Applications

△ [10p-N401-8] SEM using graphene-oxide-semiconductor type planar electron source

[10p-N401-9] Electron Emission from Planar-type Electron Source based on Nanocrystalline Silicon (II)

[10p-N401-10] Highly efficient electron emission mechanism of a graphene/SiO₂/n-Si stacked structure

Authenticate

Sessions

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[10a-N401-1~9] 7.2 Applications and technologies of electron beams

△ [10a-N401-1] Atomic-resolution STEM analysis of delithiated/pristine interface in Li2MnO3

△ [10a-N401-2] Visualization of Oxygen 2p Orbital by Electron Microscopy

[10p-N401-1~10] 7.2 Applications and technologies of electron beams

△ [10p-N401-7] Resistance Improvement of Graphene-Oxide-Semiconductor Planar-Type Electron Sources Against Atomic Oxygen for Low Earth Orbit Applications

△ [10p-N401-8] SEM using graphene-oxide-semiconductor type planar electron source

Authenticate

△ [10a-N401-1] Atomic-resolution STEM analysis of delithiated/pristine interface in Li₂MnO₃