2021年第82回応用物理学会秋季学術講演会

講演情報

一般セッション(口頭講演)

13 半導体 » 13.7 化合物及びパワーデバイス・プロセス技術・評価

[11p-N305-1~10] 13.7 化合物及びパワーデバイス・プロセス技術・評価

2021年9月11日(土) 13:30 〜 16:15 N305 (口頭)

矢野 裕司(筑波大)

15:45 〜 16:00

[11p-N305-9] High-Temperature Operation of Differential Amplifier Based on 4H-SiC MOSFETs for Harsh Environment Applications

Cuong Van Vuong1、Tetsuya Meguro1、Tadashi Sato1、Shin-Ichiro Kuroki1 (1.RNBS, Hiroshima Uni.)

キーワード:4H-SiC MOSFET, Differential Amplifier, High temperature

In this research, the operation of differential amplifier based on 4H-SiC MOSFETs at temperature up to 500℃ was investigated. Based on the ID-VG, and ID-VDS characteristics measured at 500℃ indicated that, with our fabrication process, the 4H-SiC MOSFETs had ability to operate in high temperature ambient. Whereas, the stability of the output signal of the amplifier conducted at 500℃ showed that the integrated circuit based on 4H-SiC MOSFETs could operate well at 500℃. This research demonstrated that the integrated electronic circuit based on 4H-SiC MOSFET technology is promising for high-temperature applications.