The 82nd JSAP Autumn Meeting 2021

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power devices, process technology and characterization

[11p-N305-1~10] 13.7 Compound and power devices, process technology and characterization

Sat. Sep 11, 2021 1:30 PM - 4:15 PM N305 (Oral)

Hiroshi Yano(Univ. of Tsukuba)

3:45 PM - 4:00 PM

[11p-N305-9] High-Temperature Operation of Differential Amplifier Based on 4H-SiC MOSFETs for Harsh Environment Applications

Cuong Van Vuong1, Tetsuya Meguro1, Tadashi Sato1, Shin-Ichiro Kuroki1 (1.RNBS, Hiroshima Uni.)

Keywords:4H-SiC MOSFET, Differential Amplifier, High temperature

In this research, the operation of differential amplifier based on 4H-SiC MOSFETs at temperature up to 500℃ was investigated. Based on the ID-VG, and ID-VDS characteristics measured at 500℃ indicated that, with our fabrication process, the 4H-SiC MOSFETs had ability to operate in high temperature ambient. Whereas, the stability of the output signal of the amplifier conducted at 500℃ showed that the integrated circuit based on 4H-SiC MOSFETs could operate well at 500℃. This research demonstrated that the integrated electronic circuit based on 4H-SiC MOSFET technology is promising for high-temperature applications.