[11p-N323-1~13] 12.2 Characterization and Materials Physics

[11p-N323-4] Nanoscale Charge Transport in n-Type Semiconducting Polymer Thin Films Studied by Conductive AFM

〇Toshiki Kawanishi¹, Anjar Taufik Hidayat¹, Hiroaki Benten¹, Noboru Ohota², Azusa Muraoka³, Manish Pandey¹, Masakazu Nakamura¹ (1.NAIST, 2.JASRI, 3.Japan Womens Univ)

Keywords:conductive atomic force microscopy, semiconducting polymer thin films, charge transport

The charge transport properties of polymer semiconductor materials are governed by the microstructure of the thin film. So far, it has been difficult to clarify the local electron transport properties of thin films of n-type polymer semiconductors. The surface of polymer semiconductors is characterized by relatively high mechanical strength, smoothness, and low friction surface with low free energy, which enables stable electrical contact with the metal-coated tip of an atomic force microscope. In this study, we fabricated electron injection counter electrodes that are stable in air, and evaluated the electron transport properties of n-type semiconducting polymer thin films at the nanometer scale by using conductive atomic force microscopy (C-AFM).