Keywords:carbon nanotube, photoluminescence spectroscopy
In order to realize single-walled carbon nanotube (SWNT) chiral selective growth, it is important to elusidate the mechanism of SWNT chirality (n,m) selectivity. For this purpous, an accurate evaluation method for chirality distribuion of grown SWNTs without post-growth processing and liquid-disepartion of SWNTs is indespensable. Here, we used photoluminescence spectroscopy to directly measure the chirality distributions of individual SWNTs suspended on a pillar-patterned substrate. We confirmed that the growth yield of SWNTs primarily depends on the chiral angle in accordance with the screw dislocation model [Proc. Natl. Acad. Sci. USA, 2009, 106, 2506-2509]. Furthermore, when higher yield chiralities are selected, the chiral angle distribution with a peak at near-armchair SWNTs is well fitted with the model [Nat. Commun., 2014, 5, 1-6]. Our quantitative and statistical data provid new insight into SWNT growth mecanisum as well as experimental confirmation of theoritical predictions.
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