The 82nd JSAP Autumn Meeting 2021

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power devices, process technology and characterization

[12p-N305-1~14] 13.7 Compound and power devices, process technology and characterization

Sun. Sep 12, 2021 1:30 PM - 5:15 PM N305 (Oral)

Kenji Shiojima(Univ. of Fukui), Kozo Makiyama(Sumitomo Electric Industries, Ltd.)

5:00 PM - 5:15 PM

[12p-N305-14] 5.0 kV normally-off β-Ga2O3 vertical transistor with HfO2 gate-insulator

Daiki Wakimoto1, Chia-Hung Lin1, Quang Tu Thieu1, Hironobu Miyamoto1, Kohei Sasaki1, Akito Kuramata1 (1.Novel Crystal Tech.)

Keywords:beta-Gallium Oxide, vertical MOS transistor, HfO2 gate-insulator

High-voltage vertical β-Ga2O3 MOSFETs are developed with a low charge concentration of 4x1015 cm−3 and 45 mm-thick drift-layer. The developed device shows three terminal breakdown voltages to reach up to 5000 V without edge termination. The breakdown voltage is 1.9 times higher than that of the previously reported value of vertical Ga2O3 MOSFETs.