The 82nd JSAP Autumn Meeting 2021

Presentation information

Oral presentation

13 Semiconductors » 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[13a-N304-1~11] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

Mon. Sep 13, 2021 9:00 AM - 12:00 PM N304 (Oral)

Yukinori Ono(Shizuoka Univ.)

9:15 AM - 9:30 AM

[13a-N304-2] A Charge-Based Analytical Threshold Voltage Definition Applicable to Cryogenic Temperatures

KIYOSHI TAKEUCHI1, TOMOKO MIZUTANI1, TAKUYA SARAYA1, MASAHARU KOBAYASHI1,2, TOSHIRO HIRAMOTO1 (1.IIS, Univ. Tokyo, 2.d.lab, Univ. Tokyo)

Keywords:threshold voltage

While analytically defined threshold voltage (Vth) is important for modeling MOSFET operations, there are several shortcomings with the conventional 2(Eb-Ei) definition such as inapplicability to thin film devices (FinFET, FDSOI etc.) and inappropriate behavior at near zero temperature. To solve this problem, a new definition of Vth based on a standardized charge density vs voltage relationship is proposed.