The 82nd JSAP Autumn Meeting 2021

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

[13p-N101-1~18] 15.4 III-V-group nitride crystals

Mon. Sep 13, 2021 1:00 PM - 6:00 PM N101 (Oral)

Masataka Imura(NIMS), Tomoyuki Tanikawa(Osaka Univ.), Shuhei Ichikawa(Osaka Univ.)

1:00 PM - 1:15 PM

[13p-N101-1] High-Resolution Mass Spectrometry Analysis of the Reactions Between Trimethylgallium and Ammonia in GaN MOVPE Using Hydrogen Isotope Labeling

Zheng Ye1, Shugo Nitta1, Yoshio Honda1,2, Markus Pristovsek1, Hiroshi Amano1,3,4 (1.IMaSS, Nagoya Univ., 2.IAR, Nagoya Univ., 3.ARC, Nagoya Univ., 4.VBL, Nagoya Univ.)

Keywords:Gas phase reaction, carbon

Based on the requirements of high breakdown voltage vertical GaN-based power devices, reducing unintentional carbon (C) incorporation in the thick drift layers is required. Metalorganic vapor phase epitaxy (MOVPE) is a common crystal growth method of GaN devices. Since the direct source of C is the trimethylgallium (Ga(CH3)3, TMGa) precursor, an in-depth understanding of the growth process of GaN in MOVPE is necessary. Recently, we employed a time-of-flight mass spectrometry (TOF-MS) for vapor phase reaction analysis of GaN growth. H2 promotes the decomposition of Ga(CH3)3, but how the precursors reacts to each other in the Ga(CH3)3/NH3/H2 system is not clear. In order to further understanding the mechanisms of GaN growth, we used D2 (Deuterium, H2 isotope) as a carrier gas to trace the specific reaction process of Ga(CH3)3 and NH3 in this study. As a result, it is shown that Ga(CH3)3 reacts preferentially with NH3 instead of D2. NH3 plays a dominant role in Ga(CH3)3 decomposition process, which leads to suppression of the C incorporation in GaN growth at a high V/III ratio.