Development of 3D-AFM Data Processing Method for Extracting Characteristic 3D Structures

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Mon. Sep 13, 2021 1:00 PM - 5:45 PM N301 (Oral)

Takashi Ichii(Kyoto Univ.), Keisuke Miyazawa(Kanazawa Univ.)

4:30 PM - 4:45 PM

〇Tomohiro Maesaka¹, Naoyuki Miyashita¹, Keisuke Miyazawa¹, Marcos Penedo Garcia¹, Kazuki Miyata¹, Takeshi Fukuma¹ (1.Kanazawa Univ.)

Keywords:Atomic Force Microscopy, 3D imaging