KPFM measurement of plasmon induced charge separation on Au nano-particle/ TiO<sub>2</sub> interface

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Mon. Sep 13, 2021 1:00 PM - 5:45 PM N301 (Oral)

Takashi Ichii(Kyoto Univ.), Keisuke Miyazawa(Kanazawa Univ.)

4:45 PM - 5:00 PM

〇Tomoki Misaka¹, Kentaro Kajimoto¹, Ohyama Hiroshi¹, Takuya Matsumoto¹ (1.Osaka Univ.)

Keywords:Atomic force microscopy, Kelvin probe force microscopy