[21p-P07-1~5] 3.9 Terahertz technologies

[21p-P07-4] Highly sensitive distance measurement by frequency shift terahertz-wave for low reflective target

〇Minoru Honjo¹, Masaki Mayaguchi¹, Koji Suizu¹ (1.Chiba Inst Tech.)

Keywords:terahertz-wave, distance measurement

Terahertz-waves are expected to apply for non-distractive inspection, because that has high Transparency and lower photon energy electromagnetic waves. We have developed a frequency shift terahertz wave source pumped by a frequency shifted feedback laser, and have increased accuracy of optical frequency domain reflectometry in the terahertz-wave range. Here, we successfully measured thickness of the low reflection target by increasing output power of a frequency shift terahertz wave and increasing the measurement sensitivity.