Munetaka Noguchi

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Speaker, Author, Co-Author

Tue. Mar 16, 2021 1:30 PM - 5:30 PM Z07 (Z07)

Symposium (Oral)
| Symposium
| Power device technology trends and future prospects

[16p-Z07-1~11] Power device technology trends and future prospects

2:45 PM - 3:00 PM

[16p-Z07-4] Effect of Electron Capture in SiC MOSFETs on V_th under High Gate Oxide Electric Field Stress

〇Munetaka Noguchi¹, Akihiro Koyama¹, Toshiaki Iwamatsu¹, Hiroyuki Amishiro¹, Hiroshi Watanabe¹, Naruhisa Miura¹ (1.Advanced Technology R&D Center, Mitsubishi Electric Corp.)