Kazuyori Oura

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Speaker, Author, Co-Author

Wed. Mar 17, 2021 3:00 PM - 3:50 PM P06 (Poster)

Poster presentation
| 21 Joint Session K "Wide bandgap oxide semiconductor materials and devices"
| 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[17p-P06-1~11] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

3:00 PM - 3:50 PM

[17p-P06-6] Repeated bending durability characterization of oxide thin films formed on flexible substrates and structural analysis by X-ray diffraction measurements

〇(D)Kazuyori Oura¹, Toshihiro Kumatani¹, Hideo Wada¹, Masatoshi Koyama¹, Toshihiko Maemoto¹, Shigehiko Sasa¹ (1.Osaka Inst. of Tech.)

Fri. Mar 19, 2021 1:30 PM - 6:00 PM Z33 (Z33)

Oral presentation
| 21 Joint Session K "Wide bandgap oxide semiconductor materials and devices"
| 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[19p-Z33-1~16] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

2:00 PM - 2:15 PM

△ [19p-Z33-3] Fabrication of bilayer oxide thin-film-transistors by a solution process and dependence of sintering atmosphere and film thickness of AZO buffer layers

〇(D)Kazuyori Oura¹, Hideo Wada¹, Masatoshi Koyama¹, Toshihiko Maemoto¹, Shigehiko Sasa¹ (1.Osaka Inst. of Tech.)